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Piezo Stage Load vs. Settling Time
To maximize the capabilities of piezo stages, it is important to understand how different factors contribute to the performance of the system. For many applications, the resonant frequency and settling time of a stage are of primary interest. In this blogpost we explore how the resonant frequency and settling time...
Choosing a Controller Interface
There are several interfaces available for the LC.400 series, each providing a unique way to interact with the nPoint controllers. First we will cover the interfaces that come with every standard LC.400 series controller, and then we will describe the optional interfaces that can be added. Standard Interfaces USB Port...
Fundamentals of piezo stage design: range of motion, footprint and stiffness
Piezo stages are used in applications where high precision in motion, very fast movements (in milliseconds), or high force generation out of a small volume (kilo Newton) are necessary. High precision in motion is required in Atomic Force Microscopy, for example. TappingMode™ image of indentation patterns on Parafilm® acquired with...
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High Resolution Data Acquisition for Piezo Stages
In order to maximize scanning speed for photonics applications, it is often important to acquire recordings of nanopositoning stage sensor data synchronized with data collected from external sensors or detectors. The LC.400 series of controllers can record up to 8 streams of internal data simultaneously, including voltage signals measured via the...
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Raster Scanning Techniques for Photonics Applications
The nPoint LC.400 series of controllers have several internal functions for use with raster scanning. A traditional raster scan can be generated via the simple Raster Scanning GUI used in the traditional raster scan below. Additional raster scanning patterns can be generated via the arbitrary scan capability of the controller....
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Orthogonality Correction for Piezo Flexure Stages
nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying...
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